Lasertec Corporation (OTCMKTS: LSRCF) is a Japan-based technology company specializing in the design, development and manufacture of advanced inspection and metrology equipment for the semiconductor industry. Its core product lines include photomask and reticle inspection systems, wafer defect review instruments and advanced packaging inspection tools. By leveraging both electron-beam and high-resolution optical technologies, Lasertec’s systems enable chipmakers to detect and characterize critical defects at the earliest stages of manufacturing.
Founded in 1984 and headquartered in Tokyo, Lasertec has grown from a research-driven startup into a recognized supplier of front-end process control solutions. The company completed its initial public offering on the Tokyo Stock Exchange in the early 2000s and subsequently established an over-the-counter trading line in the U.S. under the symbol LSRCF to broaden its investor base. Over the years, Lasertec has expanded its R&D capabilities, introducing next-generation tools designed to meet the tightening overlay and defectivity requirements of sub-10-nanometer technologies.
Lasertec serves a global clientele that includes major semiconductor foundries, memory manufacturers and integrated device producers. In addition to its Tokyo headquarters, the company maintains regional sales and support offices in North America, Europe and across Asia. Local application engineers collaborate closely with customers to optimize tool performance and integrate inspection equipment into high-volume production lines.
Under the leadership of its executive management team, which combines semiconductor industry veterans and optics specialists, Lasertec continues to invest in emerging inspection platforms aimed at enabling advanced packaging techniques and multi-patterning lithography. By focusing on high-precision measurement, rapid defect analysis and automated data handling, the company aims to help chipmakers improve yield, reduce cycle times and accelerate technology node transitions.
AI Generated. May Contain Errors.