Onto Innovation (NYSE:ONTO) (NYSE:ONTO) is a global provider of process control and yield management solutions for the semiconductor and advanced electronics industries. Formed through the merger of Rudolph Technologies and Nanometrics in 2021, Onto Innovation combines decades of expertise in wafer metrology, inspection, and advanced imaging to help chipmakers optimize manufacturing processes and improve overall yield. The company’s solutions address critical challenges across the semiconductor production cycle, from early R&D to high-volume production.
The company’s product portfolio encompasses metrology systems for critical dimension (CD) and thickness measurement, defect inspection tools for wafer surfaces and patterned layers, and advanced analytics software for real-time process monitoring. Onto Innovation’s tools support a wide range of process technologies, including logic, memory, foundry, and advanced packaging. With ongoing investments in machine learning and data analytics, the company seeks to deliver higher precision measurements and faster throughput to meet the evolving demands of next-generation semiconductor nodes.
Onto Innovation serves a global customer base across North America, Europe, and the Asia-Pacific region, partnering with leading integrated device manufacturers, foundries, and assembly/test providers. Under the leadership of President and CEO Douglas W. Roberts, the company has continued to expand its R&D footprint and strengthen customer support operations worldwide. Onto Innovation maintains headquarters in Wilmington, Massachusetts, with additional facilities in key semiconductor hubs to ensure responsive service and collaboration with technology partners.