Nova (NASDAQ:NVMI) Measuring Instruments Ltd. (NASDAQ:NVMI) is a leading provider of semiconductor process control metrology solutions that enable chip manufacturers to optimize production yield, performance and reliability. The company’s advanced measurement platforms offer real-time data on critical parameters including film thickness, overlay alignment, critical dimension and defect density. By integrating inline metrology at key points in the wafer fabrication flow, Nova helps foundries and integrated device manufacturers maintain tight control over increasingly complex process windows.
Nova’s product portfolio spans optical and non-optical metrology technologies tailored for leading-edge nodes. Its flagship metrology systems support advanced device architectures such as FinFET transistors and 3D NAND, as well as next-generation lithography techniques. Key offerings include critical-dimension scanning electron microscopy (CD-SEM), high-resolution overlay measurement and thin-film spectral reflectometry. These solutions deliver sub-nanometer precision, enabling customers to accelerate process development and ramp high-volume manufacturing more efficiently.
The company serves a global customer base that includes major foundries, IDM operations and research institutes. Headquartered in Rehovot, Israel, Nova operates R&D and sales offices across North America, Europe and Asia—most notably in Taiwan, South Korea, China and Japan. This global footprint ensures close collaboration with leading semiconductor manufacturers and foundry ecosystems, driving continuous product enhancements aligned with evolving market demands.
Founded in 1993 and publicly listed on the NASDAQ in 2006, Nova Measuring Instruments has maintained a strong focus on innovation and strategic partnerships. Under the leadership of CEO Yoav Tzruya and an experienced executive team, the company continues to invest in R&D and expand its metrology capabilities. With a commitment to precision and customer support, Nova is well positioned to address the challenges of next-generation semiconductor manufacturing.
