Lasertec Corp is a Japan‐based manufacturer of precision inspection and measurement equipment for the semiconductor industry. The company develops and markets laser‐based metrology systems designed to detect defects, measure critical dimensions and analyze surface topography on photomasks, reticles and wafers used in advanced silicon device fabrication. Its product lineup addresses key stages in semiconductor production, including mask inspection, wafer defect review and overlay measurement.
The company’s core technology leverages high‐resolution optics and laser interferometry to provide non‐contact, high‐speed analysis of patterned surfaces. By offering tools that can identify sub‐nanometer variations and microscopic particles, Lasertec helps chipmakers achieve tighter process control, improve yield and reduce downtime. In addition to standard inspection modules, Lasertec supplies customized solutions tailored to the specific requirements of foundries and mask shops.
Founded in the early 1980s and headquartered in Nagano, Japan, Lasertec serves a global customer base that includes leading semiconductor manufacturers and photomask producers in Asia, North America and Europe. The company maintains regional sales and support offices to provide on‐site installation, maintenance and process consulting. Its international footprint enables customers to integrate Lasertec systems across multiple fabrication sites.
Lasertec’s management team comprises industry veterans with backgrounds in optics, precision instrumentation and semiconductor process engineering. By focusing on research and development, the company has introduced successive generations of inspection equipment that align with the industry’s shift toward ever‐smaller device geometries and complex multi‐patterning techniques. Lasertec remains committed to collaborating with chipmakers and research institutions to meet emerging metrology challenges in next‐generation semiconductor nodes.
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