Lasertec Corporation, trading in the U.S. OTC market under the symbol LSRCY, is a Tokyo-based manufacturer of advanced inspection and metrology equipment for the global semiconductor and flat panel display industries. The company specializes in laser-based defect inspection and measurement systems that help wafer fabs, mask shops and device manufacturers maintain high yield and quality control throughout photomask, reticle, wafer and display production processes.
Lasertec’s product portfolio includes high-resolution reticle and mask inspection systems, wafer defect inspection tools and overlay metrology equipment. Its flagship review systems utilize laser scanning and dark-field imaging technologies to detect sub-micron defects on reticles and masks, while its wafer inspection platforms identify particle contamination and process-induced anomalies on production wafers. In addition, Lasertec offers metrology solutions that measure overlay and alignment with nanometer-level precision.
Founded in the late 1970s and rebranded as Lasertec Corporation in 1988, the company has built a reputation for innovation in laser optics and semiconductor instrumentation. Lasertec operates R&D and manufacturing facilities in Japan and maintains a network of sales and support offices across Asia, North America and Europe to serve regional chipmakers, foundries and photomask suppliers. Its global footprint allows it to deliver timely technical support and on-site services to customers in key semiconductor hubs.
Lasertec’s management team comprises executives with extensive experience in semiconductor equipment development and process control. The company continues to invest in research and development to address emerging challenges in next-generation lithography, including extreme ultraviolet (EUV) mask inspection and advanced node metrology applications.
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