Camtek (NASDAQ:CAMT) (NASDAQ: CAMT) is a provider of automated inspection and metrology solutions for the semiconductor and printed circuit board (PCB) industries. The company develops, manufactures and markets a suite of inline and stand-alone systems that perform high‐resolution 2D and 3D measurements, defect review and process control. Its products are used by integrated device manufacturers, foundries, OSAT (outsourced semiconductor assembly and test) providers, and PCB fabricators to optimize yield, improve product quality and reduce production costs.
Camtek’s core offerings include wafer inspection systems that detect and classify defects on patterned wafers, patterned wafer metrology tools for overlay and critical dimension measurements, and advanced packaging inspection platforms for 3D ICs and fan-out wafer-level packaging. The company also provides specialized inspection solutions for PCB and semiconductor component inspection, enabling manufacturers to verify solder joints, detect surface defects and ensure alignment accuracy on complex multi-layer boards.
Founded in 1987 and headquartered in Migdal HaEmek, Israel, Camtek has established a global footprint with R&D centers in Israel and sales and support offices across Asia, Europe and North America. In 2006, the company expanded its capital base by listing on the Nasdaq Capital Market, complementing its long‐standing presence on the Tel Aviv Stock Exchange. Over the years, strategic investments in R&D and targeted acquisitions have broadened Camtek’s product portfolio and reinforced its position in key growth markets such as advanced packaging and automotive electronics.
Led by an experienced management team with deep expertise in semiconductor equipment, Camtek focuses on continuous innovation to address emerging industry challenges. Its customer base spans major semiconductor and PCB manufacturers worldwide, and the company maintains collaborative partnerships with leading research institutes and industry consortia to drive next‐generation inspection and metrology technologies.
